(Technology Transfer) X-ray diffraction (XRD) characterization methods for sigma=3 twin defects in cubic semiconductor (100) wafers

Year of publication

2025

Inventor

Hyun Jung Kim, Yeonjoon Park, Jonathan R. Skuza, Kunik Lee, Glen C. King, Sang H. Choi

Application No.

Application date

Registration No.

US 9,835,570

Registration date

December 5, 2017

Publication No.

NASA Case No. LAR-18306-1

Published date

November 30, 2012

Firm No.

License #DN-2385

Firm date

April 15, 2025

Agency

Licensed to Global Photonics Solutions LLC