Patent 페이지 | 카이스트 김현정 교수님 연구실

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Space Testing And payload sensoR

Patent

Total 2건 1 페이지

2009
2

A Measuring System for PRAM Fatigue Using Atomic Force Microscope and Homemade W Heater Tip and Controlling Method Thereof Inventor : Hyun Jung Kim, Si Kyung Choi
Registration No. : 1008884690000 Registration date : March 2009
Korea Patent
1

Method for manufacturing single crystal nano-structures capable of controlling morphology and device for manufacturing nanostructures Inventor : Hyun Jung Kim, Si Kyung Choi
Publication No. : US 2009/0084310 A1 Published date : April 2009
US Patent

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