The estimation of the crystalline behavior and electrical property of nominal-composition GeSbTe thin films for phase change random access memory (PRAM) 

Year

2005 

Author

Hyun Jung Kim 

Co-author

H. J. Kim, S. K. Choi 

Conference

GIST/KAIST/Kyoto University/Tohoku University Joint Symposium on Advanced Materials, GIST 

Vol

Korea