High-Electron- Mobility SiGe on Sapphire Substrate for Next Generation Ultrafast Chipsets 

Year

2012 

Author

Hyun Jung Kim 

Co-author

Hyung Bin Bae, Yeonjoon Park, Sang H. Choi 

Conference

AVS 59th International Symposium & Exhibition (Oxides and Dielectric for Novel Devices and Ultra-dense Memory) 

Status

October 

Vol

Tampa, FL