Observation of GeSbTe Thin Film Phase Transition Behavior According to the Number of Cycles Using Transmission Electron Microscope (TEM) and Scanning Probe Microscope (SPM) 

Year

2007 

Author

Hyun Jung Kim 

Co-author

S. K. Choi, S. H. Kang, K. H. Oh, S. Y. Kweon 

Conference

Mater. Res. Soc. Symp. Proc. Vol. 961, Material Research Society (0961-O03-04)